Patent · US Active

Method to reduce wedge effects in molded trigonal tips

US8701211B2 · kind B2 · utility

1Cited by
13References
39Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 25, 2010
Grant dateApr 15, 2014
Priority date
Expiry dateFeb 9, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01Q70/16
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of producing sharp tips useful for scanning probe microscopy and related applications is described. The tips are formed by deposition into a mold(s) formed in a sacrificial crystalline semiconductor substrate with an exposed {311} surface which has been etched with a crystallographic etchant to form a 3-sided, trihedral or trigonal pyramidal mold(s) or indentation(s). The resultant tips, when released from the sacrificial mold material or substrate, are typically formed in the shape of a trigonal pyramid or a tetrahedron. Another embodiment involves starting with a {100} surface and the formation of two tips on opposite ends of a wedge at trigonal or trihedral points of the wedge. These tips are less susceptible to the tip wedge effect typical of tips formed using known methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.