Electronic devices for defect detection
US8705839B2 · kind B2 · utility
2Cited by
2References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2011 |
| Grant date | Apr 22, 2014 |
| Priority date | — |
| Expiry date | Jun 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20056
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An electronic device configured for defect detection is described. The electronic device includes a processor and instructions stored in memory that is in electronic communication with the processor. The electronic device performs background suppression on the image data based on a transform of the image data to obtain a score map. The electronic device also applies thresholding to the score map to generate a detection mask. The thresholding comprises bi-thresholding. The electronic device additionally detects any defects based on the detection mask. The electronic device further indicates any defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.