Time domain reflectometry step to S-parameter conversion
US8706433B2 · kind B2 · utility
3Cited by
3References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 31, 2011 |
| Grant date | Apr 22, 2014 |
| Priority date | — |
| Expiry date | Apr 16, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.