Patent · US Active

Calibration of particle detectors

US8706437B2 · kind B2 · utility

2Cited by
0References
26Claims
0Family size

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Key dates

Filing dateOct 12, 2009
Grant dateApr 22, 2014
Priority date
Expiry dateDec 10, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J11/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of calibrating an optical detector arrangement (38,42) comprises simultaneously generating a plurality of entangled photon pairs, such that one photon from each pair traverses a first path (36-38-42) and the other photon from each pair traverses a second path (36-40-44). The number of photons received along the first path is calculated using the detector arrangement (38,42), while the number of simultaneously-generated photons received along the second path is calculated using a second detector arrangement (40,44). These photon numbers are used to calculated an estimate of the detection efficiency (50) of the first detector arrangement (38,42).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.