Method and system for measuring memory access time using phase detector
US8707001B2 · kind B2 · utility
0Cited by
8References
22Claims
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Key dates
| Filing date | Dec 4, 2008 |
| Grant date | Apr 22, 2014 |
| Priority date | — |
| Expiry date | May 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C7/22
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for determining a memory access time are provided. A first phase skew is measured between a first clock signal used by a memory and a second clock signal used as a reference clock signal. Then, a second phase skew is measured between a delayed version of the first clock signal output by the memory when the memory completes a given read operation and the second clock signal. The memory access time is determined based on the first and second phase skews.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.