Systems and methods for error injection in data storage systems
US8707104B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2011 |
| Grant date | Apr 22, 2014 |
| Priority date | — |
| Expiry date | May 28, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the solid-state storage system provided herein are configured to perform improved mechanisms for testing of error recovery of solid state storage devices. In some embodiments, the system is configured to introduce or inject errors into data storage commands or operations performed in the non-volatile memory. Injected errors include corruption of data stored in the non-volatile memory, deliberate failure to execute storage operations, and errors injected into communication protocols used between various elements of the device. In some embodiments, injected errors can include direct errors that trigger an immediate execution of error recovery mechanisms and delayed errors that trigger execution of error recovery mechanisms at a later time. Error recovery mechanisms can be tested in an efficient, reliable, and deterministic manner to help ensure effective operation of storage devices. The integrity of non-volatile memory can also be tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.