System and method for predicting remaining useful life of device components
US8712726B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2010 |
| Grant date | Apr 29, 2014 |
| Priority date | — |
| Expiry date | Nov 18, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0283
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and system for accurately predicting the remaining useful life of devices and components based on rigorous statistical analysis data to reduce service costs by implementing condition-based maintenance. One rigorous statistical model is the general degradation path model, which can be used to generate simulated data that shares similar data characteristics of historical field failure data. This generated data can be used in a reliability study based on, for example, Monte Carlo techniques for RUL prediction. The study can be used to investigate the effects of influential factors such as suspension percentage and heavy-tailed behavior. The remaining useful life prediction is based on both the fixed-time predictors and time-dependent covariates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.