Patent · US Active

Sample analysis and ion detection

US8716653B2 · kind B2 · utility

0Cited by

2References

20Claims

0Family size

Assignee

WASHINGTON STATE UNIVERSITY · US

Inventors

Herbert H. Hill, Jr. · Jacksonville, US
Eric Davis · Corona, US
William F. Siems · Pullman, US

Key dates

Filing date	Mar 26, 2013
Grant date	May 6, 2014
Priority date	—
Expiry date	Mar 26, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N27/622
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Various embodiments of ion detection systems, devices, and associated methods of operation are described herein. In one embodiment, a method for ion detection includes separating a target species from other species in an ionized sample of a first polarity, generating ions of a second polarity opposite the first polarity, and contacting ions of the second polarity with the ionized sample to generate emissions after separating the target species from other species in the ionized sample. The method also includes detecting the generated emissions when combining the ionized sampled of the first polarity with the ions of the second polarity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.