Method and apparatus for accurately measuring currents using on chip sense resistors
US8717051B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 14, 2010 |
| Grant date | May 6, 2014 |
| Priority date | — |
| Expiry date | Jan 16, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S323/907
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for managing process and temperature variations for on-chip sense resistors are disclosed. The system includes a circuit that can leverage a linear gm circuit in order to provide linear gains (positive gains and/or negative gains). The linearity of the circuit enables compensation for temperature and process variations across an entire range of current (positive to negative). A control signal is generated by using a linear gm amplifier and a replica resistor, which is substantially similar to the on chip resistor. The control signal is used to control the gain of a disparate linear gm amplifier within a compensation circuit, which provides an offset voltage to compensate for the variation in resistance of the on chip resistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.