System for calibrating an electronic lapping guide for a beveled pole in a magnetic recording transducer
US8717709B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2012 |
| Grant date | May 6, 2014 |
| Priority date | — |
| Expiry date | Oct 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/3169
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A wafer comprises a transducer having an air-bearing surface (ABS) and including a magnetic structure characterized by a desired thickness, and having a bevel and a flare point a first distance from the ABS. The wafer further comprises a first electronic lapping guide (ELG), a second ELG, and a third ELG. The first ELG has a first edge a first distance from the ABS and a second edge a second distance from the ABS. The second ELG has a third edge a third distance from the ABS and a fourth edge the second distance from the ABS. The third ELG has a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS. At least one of the first distance and the second distance, at least one of the third distance and the second distance, and at least one of the fourth distance and the second distance correspond to an intersection between the bevel and the desired thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.