Positional measurement of a feature within an image
US8718403B2 · kind B2 · utility
1Cited by
9References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2003 |
| Grant date | May 6, 2014 |
| Priority date | — |
| Expiry date | Jan 5, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/245
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The position of a feature within an image is determined by determining an initial estimate of the feature position to within a fraction of a pixel, translating the feature by an amount equal to that fraction of a pixel, determining a further estimate of the translated feature position to within a fraction of a pixel and summing the pixel fraction of the previous estimate with the further estimate of the position to arrive at a refined estimate of the feature position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.