Parametric trace slicing
US8719796B2 · kind B2 · utility
24Cited by
8References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2011 |
| Grant date | May 6, 2014 |
| Priority date | — |
| Expiry date | Apr 18, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/86
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.