Method for calibrating an electronic chip, electronic chip and heat pattern detector for this method
US8721172B2 · kind B2 · utility
0Cited by
7References
12Claims
0Family size
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Key dates
| Filing date | May 6, 2011 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Oct 23, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for calibrating an electronic chip comprises: the placing of a calibration transducer of a chip to be calibrated in contact with a first element and the measurement of a corresponding temperature variation ΔTc with this calibration transducer, the calibration thermal transducer having thermal characteristics different from those of the normal transducer so as to measure a temperature variation ΔTc that is different from a variation ΔT1 measured by the normal transducer, and the calibration of the chip to be calibrated on the basis of the measured variations ΔT1 and ΔTc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.