Methods and system for on-chip decoder for array test
US8722432B2 · kind B2 · utility
1Cited by
2References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2010 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Nov 9, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides devices capable of testing the electrical performance of thin-film transistor backplane arrays and methods for their use.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.