Method for analyzing DC superposition characteristics of inductance device, and electromagnetic field simulator
US8723508B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2009 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Jun 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing the DC superposition characteristics of an inductance device using an electromagnetic field simulator, comprising a first step of determining an initial magnetization curve from initial magnetization to saturation magnetization, and pluralities of minor loops at different operating points, on a toroidal core made of the same magnetic material as that of the inductance device, and obtaining point-list data showing the relation between magnetic flux density or magnetic field strength and incremental permeability from the incremental permeability at each operating point; a second step of determining an operating point at a predetermined direct current on each element obtained by mesh-dividing an analysis model of the inductance device by an electromagnetic field simulator based on the initial magnetization curve of the core, allocating the incremental permeability to the operating point from the point-list data, and integrating the inductance of each element obtained from the incremental permeability to determine the inductance of the entire inductance device; and a third step of repeating the second step at different direct current levels to determine the DC su…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.