Method for measuring system parameter of linear multiport and measuring method using vector network analyzer
US8725442B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Feb 2, 2010 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Feb 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}−1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.