Latency measurement
US8725443B2 · kind B2 · utility
15Cited by
33References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2011 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Aug 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.