Method for testing in a reconfigurable tester
US8725489B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 30, 2008 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Jan 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/261
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In some implementations, a method for testing is provided, which includes simulating a functional operational environment for a first type device-under-test with a tester. This includes recognizing a non-deterministic response signal having a predetermined protocol, receiving the non-deterministic response signal from the first type device-under-test, ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol, and initiating transmission of the expected stimulus signal to the first type device-under-test. The method further includes simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.