Patent · US Active

Method for producing aluminum nitride crystals

US8735905B2 · kind B2 · utility

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Key dates

Filing dateJul 14, 2011
Grant dateMay 27, 2014
Priority date
Expiry dateJul 14, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Provided is a method for producing inexpensive and high-quality aluminum nitride crystals. Gas containing N atoms is introduced into a melt of a Ga—Al alloy, whereby aluminum nitride crystals are made to epitaxially grow on a seed crystal substrate in the melt of the Ga—Al alloy. A growth temperature of aluminum nitride crystals is set at not less than 1000 degrees C. and not more than 1500 degrees C., thereby allowing GaN to be decomposed into Ga metal and nitrogen gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.