Delay line calibration
US8736384B2 · kind B2 · utility
4Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 29, 2010 |
| Grant date | May 27, 2014 |
| Priority date | — |
| Expiry date | Apr 29, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03L7/1978
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
In some embodiments, provided are calibration techniques for measuring mismatches between TDL delay stage elements, and in some cases, then compensating for the mismatches to minimize performance degradation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.