Detection and identification of surfaces and surface contaminants
US8743363B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 4, 2013 |
| Grant date | Jun 3, 2014 |
| Priority date | — |
| Expiry date | Feb 4, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/94
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the subject technology relate to methods and systems for identifying a target material. The system includes a tunable laser, an imaging device, and a signal processor. The tunable laser is configured to intermittently direct electromagnetic radiation of at least one selected wavelength at a surface of a target material. The imaging device is configured to capture at least one “on” image of the surface when the electromagnetic radiation of the at least one selected wavelength is directed at the surface and capture at least one “off” image of the surface when electromagnetic radiation of the at least one selected wavelength is not directed at the surface. The signal processor is configured to compare, for each selected wavelength, the “on” image(s) corresponding to the selected wavelength with the “off” image(s) corresponding to the selected wavelength and identify the target material based on the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.