Systems and methods for recording defects
US8744886B1 · kind B1 · utility
4Cited by
8References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2008 |
| Grant date | Jun 3, 2014 |
| Priority date | — |
| Expiry date | May 7, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/08
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
Disclosed are various systems, methods, and other embodiments for processing and recording defects. In one embodiment, an application is executed in a server that processes and records defects detected by a user at a receiving station client. Based on a retrieved vendor profile, the application selects an inspection sequence for a user to execute. The inspection sequence is selected based on a history of defects specified in the vendor profile. The application also determines whether supervision is needed based on the performance of the user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.