System and method for analyzing an electronics device including a logic analyzer
US8745447B2 · kind B2 · utility
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22References
17Claims
0Family size
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Key dates
| Filing date | Dec 31, 2010 |
| Grant date | Jun 3, 2014 |
| Priority date | — |
| Expiry date | Aug 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2294
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing or debugging a system including the integrated circuit having an embedded logic analyzer. In one embodiment, the system includes a computing device coupled to the logic analyzer for receiving the at least one output. A user interface run on the computing device assigns an attribute to at least one signal associated with the logic analyzer, determines a new signal or value not provided by the logic analyzer, the new signal or value being based upon the at least one signal as received from the logic analyzer and upon a predetermined definition, and presents the new signal or value to a system user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.