Patent · US Active

Grinding/electrolysis combined multi-wire-slicing processing method for silicon wafers

US8747625B2 · kind B2 · utility

1Cited by
1References
6Claims
0Family size

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Key dates

Filing dateJul 14, 2010
Grant dateJun 10, 2014
Priority date
Expiry dateSep 26, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A grinding/electrolysis combined multi-wire-slicing processing method for silicon wafers includes the following steps: first, with a metal slicing wire (10) provided on a multi-wire-slicing machine serving as cathode, a silicon rod or a silicon ingot (1) (anode) is processed by grinding/electrolysis combined multi-wire-slicing through application of a voltage; second, during said processing, the metal slicing wire (10) and the silicon rod or a silicon ingot (1) are connected with a low-voltage continuous or pulsed direct current power supply (9); third, an electrolytic liquid is sprayed into the cutting area to ensure cooling and anode erosion. The method reduces macroscopic cutting force and enables a grinding/electrolysis combined multi-wire-slicing processing method for large size ultra-thin silicon wafers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.