Patent · US Active

Microwave plasma apparatus and method for materials processing

US8748785B2 · kind B2 · utility

32Cited by
48References
19Claims
0Family size

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Key dates

Filing dateJan 17, 2008
Grant dateJun 10, 2014
Priority date
Expiry dateAug 23, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H1/30
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A microwave plasma apparatus for processing a material includes a plasma chamber, a microwave radiation source, and a waveguide guiding microwave radiation from the microwave radiation source to the plasma chamber. A process gas flows through the plasma chamber and the microwave radiation couples to the process gas to produce a plasma jet. A process material is introduced to the plasma chamber, becomes entrained in the plasma jet, and is thereby transformed to a stream of product material droplets or particles. The product material droplets or particles are substantially more uniform in size, velocity, temperature, and melt state than are droplets or particles produced by prior devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.