Detection and correction of a loss of calibration of microbolometer thermal imaging radiometers
US8748808B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2012 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Sep 16, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method detects a loss of calibration of a thermal imaging radiometer including an array of imaging microbolometers and a gauge microbolometer. The detection method includes applying a first and a second electrical stimulation to the gauge microbolometer to bring it to a first and a second predetermined temperature, followed by measuring an ohmic responsivity of the gauge microbolometer that is representative of a difference between the first and second electrical stimulations. The measured ohmic responsivity is compared with a reference ohmic responsivity, such that a loss of calibration is signaled whenever the measured and reference ohmic responsivities differ by more than a predetermined threshold. A correction method includes steps of the detection method, to yield a corrected voltage response function for each imaging microbolometer. Advantageously, the methods involve probing the electrical response of the gauge microbolometer without requiring thermoregulated blackbody calibrations sources.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.