Patent · US Active

Orientation imaging using wide angle convergent beam diffraction in transmission electron microscopy

US8748817B2 · kind B2 · utility

1Cited by
2References
8Claims
0Family size

Inventor

Key dates

Filing dateJul 27, 2011
Grant dateJun 10, 2014
Priority date—
Expiry dateDec 4, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2802
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods of orientation imaging microscopy (OIM) techniques generally performed using transmission electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed may use a wide angle convergent beam electron diffraction for performing OIM by generating a diffraction pattern having at least three diffraction discs that may provide additional information that is not available otherwise.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.