Integrated photodiode wavelength monitor
US8749772B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2010 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Feb 20, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/4006
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An optical wavelength monitor photodiode integrated on a wafer and/or an optical device and coupled to optical components thereof provides wavelength measurement. The optical wavelength monitor includes a photodiode configured to output a signal that is representative of a wavelength of the light. An additional photodiode may be included in the optical wavelength monitor, each photodiode differing from the other in operating characteristics. The monitor may be used in testing the optical device while in wafer form and when the optical device has been cleaved from the wafer at the bar level. Testing/monitoring of the optical device may also be performed during use, for example, to control the wavelength of a laser such as a tunable laser.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.