Device for optical measurement of materials, using multiplexing of light
US8749792B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2012 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Aug 28, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for optical measurement of materials includes a zone opposite a dot including a material, a light source emitting light along an axis in the direction of the zone, where the material interacts with the light it receives, and a light guide to convey a proportion of the light emitted by the dot under the effect of the illumination. The guide includes a light scatterer associated with the source and causing a proportion of the light emitted by the dot to penetrate into the guide, such that it is guided in a direction perpendicular to the axis; the scatterer is annular in shape, and thus delimits a zone of the light guide, and the area of the zone is greater than or equal to the area of the cross-section of the portion of light beam incident to the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.