Nearfield testing architecture
US8750354B1 · kind B1 · utility
4Cited by
8References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 10, 2011 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Nov 17, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B5/70
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An open architecture design for a digital nearfield test system for nearfield testing of a phased array antenna allows the ability to use the components of an individual phased array antenna to be tested in conjunction with a nearfield scanner probe system allowing an efficient and cost-saving “radar testing the radar” scenario.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.