High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials
US8750454B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2011 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Aug 14, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.