Method of detecting material in a part
US8750561B2 · kind B2 · utility
1Cited by
15References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 29, 2012 |
| Grant date | Jun 10, 2014 |
| Priority date | — |
| Expiry date | Aug 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/652
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes the steps of producing a first digital x-ray image of a part utilizing a full energy spectrum, producing a second digital x-ray image of the part with a hardened beam correlating to a higher energy portion of the full energy spectrum, subtracting the second x-ray image from the first x-ray image, and using a remainder of the subtracting step to locate the matter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.