Patent · US Active

Method for checking suitability of a data processing device for performing failsafe automation processes

US8751875B2 · kind B2 · utility

0Cited by

7References

15Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Andreas Schenk · Erlangen, DE
Markus Walter · Wertheim, DE

Key dates

Filing date	Apr 15, 2010
Grant date	Jun 10, 2014
Priority date	—
Expiry date	Jul 13, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/1608
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for checking a data processing device to determine its suitability for performing failsafe automation processes, wherein the data processing device includes a first and a second time base. The method comprises determining a first time value of the first time base after expiration of a time period of length T, determining a second time value of the second time base after the expiration of the time period of length T, determining a deviation between the first and the second time value, and initiating a troubleshooting measure if the deviation undershoots, i.e., undershoots or reaches, a predefined or pre-definable limit value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.