Methods for fabricating transistors including one or more circular trenches
US8754472B2 · kind B2 · utility
0Cited by
10References
23Claims
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Key dates
| Filing date | Mar 10, 2011 |
| Grant date | Jun 17, 2014 |
| Priority date | — |
| Expiry date | Mar 10, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/62
Abstract
A transistor and a method of fabricating a transistor, including a metal oxide deposited on an epitaxial layer, a photo resist deposited and patterned over the metal oxide and the metal oxide and epitaxial layer are etched to form at least one circular trench, wherein the trench surfaces are defined by the epitaxial layer. An oxide layer is grown on the trench surfaces of each trench, and a gate conductor is formed within the at least one trench.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.