System and method for quantification of size and anisotropic structure of layered patterns
US8755578B1 · kind B1 · utility
Inventor
Key dates
| Filing date | Oct 17, 2012 |
| Grant date | Jun 17, 2014 |
| Priority date | — |
| Expiry date | Feb 23, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/162
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Parameterization of incremental patterns of various categories is provided by a computer system. The computer system initially undergoes filtering of the incremental patterns under study. Transects are plotted in a predetermined direction to growth incremental bands, and converted into an anisotropic structure in a 2-D domain. The width of the incremental bands along transects are calculated in combination with the area of incremental bands between neighboring transects. The structure of the incremental bands along with the width and area of the incremental hands across a 2-D plane for different levels of noise are calculated. Noise is reduced by averaging width and area across the 2-D plane. Indices of adequacy of the model and structural anisotropy of the incremental patterns are calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.