Systems and methods for efficient feature extraction accuracy using imperfect extractors
US8755606B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2011 |
| Grant date | Jun 17, 2014 |
| Priority date | — |
| Expiry date | Jun 30, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems (100) and methods (300) for efficient feature data analysis. The methods involve: determining a first number of screen pages needed to verify that each of a plurality of clusters of detected features comprises only detected features which were correctly identified during feature extraction/detection operations as being of the same feature class as a selected feature of an image; determining a second number of screen pages needed to verify that each of a plurality of singular detected features was correctly identified during the feature extraction/detection operations as being of the same feature class as the selected feature of the image; selecting one of a plurality of different validation processes based on values of the first number of screen pages and the second number of screen pages; and performing the selected validation process to verify that each of the detected features does not constitute a false positive.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.