Processing of azimuthal resistivity data in a resistivity gradient
US8756015B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 20, 2008 |
| Grant date | Jun 17, 2014 |
| Priority date | — |
| Expiry date | Jan 8, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for increasing sensitivity in a measurement of at least one of magnitude and direction of resistivity in a subsurface material, the method including: performing a first set of measurements of resistivity of the subsurface material using a first logging instrument; constructing a model of a background signal using the first set of measurements; calculating a predicted response of a second logging instrument to the model of the background signal; performing a second set of measurements of at least one of magnitude and direction of resistivity of the subsurface material using the second logging instrument; deriving a second logging instrument response from the second set of measurements; and subtracting the predicted response from the second logging instrument response to produce a corrected response that has greater sensitivity than the second logging instrument response.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.