Patent · US Active

Test selection based on an N-wise combinations coverage

US8756460B2 · kind B2 · utility

33Cited by

6References

18Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Dale E. Blue · Poughkeepsie, US
Rachel Tzoref-Brill · Haifa, IL

Key dates

Filing date	Apr 5, 2011
Grant date	Jun 17, 2014
Priority date	—
Expiry date	Apr 7, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3676
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Based on a functional coverage by a test suite, a functional coverage model of a System Under Test (SUT) may be defined to represent all covered combinations of functional attributes. Based on an n-wise combination criteria, a subset of the possible combinations of values may be determined. A subset of the test suite may be selected such that the selected subset is operative to cover the subset of the determined possible combinations of values. The disclosed subject matter may be used to reduce a size of the test suite while preserving the n-wise combinations coverage of the original test suite.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.