Non-contact total emission detection method and system for multi-photon microscopy
US8759792B2 · kind B2 · utility
1Cited by
4References
19Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 12, 2010 |
| Grant date | Jun 24, 2014 |
| Priority date | — |
| Expiry date | Dec 17, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2207/114
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-photon microscope having an illumination source that transmits an illumination light into a housing having an objective lens arrangement for illuminating a sample disposed outside the housing and directing a first portion of emission light emitted from the sample to a detection system is disclosed. A light collection system is disposed proximate the objective lens arrangement for directing a second portion of emission light in a coaxial relationship with the first portion of emission light to the detection system such that substantially all of the emission light on, around and above the illumination region is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.