Patent · US Active

Test head docking system and method with sliding linkage

US8760182B2 · kind B2 · utility

5Cited by

5References

20Claims

0Family size

Assignee

inTEST Corporation · US

Inventors

James Wood · Brea, US
Bryan M. Porch · Cherry Hill, US

Key dates

Filing date	Jul 10, 2009
Grant date	Jun 24, 2014
Priority date	—
Expiry date	Jan 21, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2887
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system includes a power driven actuator for powered bringing together of the electronic test head and the handling apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.