Low capacitance probe for testing circuit assembly

US8760185B2 · kind B2 · utility

Inventor

• Anthony J. Suto · Sterling, US

Key dates

• Filing date: Dec 22, 2009
• Grant date: Jun 24, 2014
• Expiry date: Dec 28, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/312
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. A second feature is a guard plate of the probe with reduced capacitance to a sense plate of the probe. Reducing capacitance also increases the sensitivity of the probe.