Patent · US Active

Method and apparatus for measuring spacings between optical surfaces of an optical system

US8760666B2 · kind B2 · utility

3Cited by

6References

8Claims

0Family size

Assignee

Trioptics GmbH · DE

Inventors

Josef Heinisch · Wedel, DE
Stefan Krey · Pinneberg, DE
Eugen Dumitrescu · Wedel, DE
Aiko Ruprecht · Wedel, DE
Patrik Langehanenberg · Wedel, DE

Key dates

Filing date	Nov 22, 2011
Grant date	Jun 24, 2014
Priority date	—
Expiry date	Jul 30, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01M11/0221
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.