Determination of memory read reference and programming voltages
US8760932B2 · kind B2 · utility
4Cited by
24References
17Claims
0Family size
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Key dates
| Filing date | Oct 18, 2011 |
| Grant date | Jun 24, 2014 |
| Priority date | — |
| Expiry date | Apr 14, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/3418
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Symmetrical or asymmetrical noise distributions for voltages corresponding to symbols that can be stored in multi-level memory cells (MLCs) of a memory device are used to determine read reference and/or programming voltages. The read reference voltages and/or programming voltages for the MLCs are jointly determined using the symmetrical distributions and a maximum likelihood estimation (MLE) and/or by determining at least one of the read reference voltages and the programming voltages using the asymmetrical distributions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.