System and method for selective distribution of measurement device configuration in a loosely coupled autonomous system
US8762076B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2005 |
| Grant date | Jun 24, 2014 |
| Priority date | — |
| Expiry date | Dec 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Probe configuration is achieved in a measurement system in which probes are given possible configuration data depending upon conditions in an area relevant to the area of the probe. The possible probe configurations include global boundaries, such as time, and each probe then, based upon the possible configurations, selects a configuration. In one embodiment, the probe may interact with a central processor to further define the probe configuration. In one embodiment, probes may communicate with other probes, both to help define their operating environment and to optionally provide configuration data to another probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.