Inertial measurement system
US8762091B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 3, 2011 |
| Grant date | Jun 24, 2014 |
| Priority date | — |
| Expiry date | Feb 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P21/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring an inertial property on a set of one or more axes is disclosed. The apparatus includes a first inertial sensor arranged to measure the inertial property, having a first predetermined resolution and a first predetermined measurement range, and a second inertial sensor arranged to measure the inertial property, having a second predetermined resolution and a second predetermined measurement range. The second resolution is coarser than the first and the second measurement range is larger than the first. A processing system is adapted to receive measurement signals from the first and second inertial sensors and, when the output of the first inertial sensor is within the first predetermined measurement range, to update an error estimate for adjusting the output of the second inertial sensor, based on the measurement signals from the first and second inertial sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.