Pattern-based optical lens testing apparatus having a module comparing a viewed image representation to a copy of target pattern and method for using the same
US8766165B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Feb 19, 2011 |
| Grant date | Jul 1, 2014 |
| Priority date | — |
| Expiry date | Mar 7, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/385
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A pattern method is provided for testing an optical lens. The method provides a lens for test, including a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space. Also provided is a pattern test fixture including an imaging device and a target pattern. The lens is positioned so that the imaging device is located outside the object space focal plane and the target pattern located is outside the image space focal plane. The imaging device, such as a microscope, magnification device, human eye, or camera, is used to view the target pattern. A viewed image representation of the target pattern is received in the imaging device and compared to the target pattern. More typically, the viewed image representation is compared to a target pattern copy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.