Sample-and-hold circuit for generating a variable sample delay time of a transformer and method thereof
US8766670B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2013 |
| Grant date | Jul 1, 2014 |
| Priority date | — |
| Expiry date | Mar 14, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00156
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A sample-and-hold circuit for generating a variable sample delay time of a transformer includes a discharge detection unit, a sample delay time generation unit, and a comparator. The discharge detection unit generates a first voltage according to a first turning-on signal and a first reference current. Length of the first turning-on signal is varied with a discharge time of a present period of the transformer. The sample delay time generation unit generates a second voltage according to the first turning-on signal and a second reference current. The comparator generates a sample signal to a control circuit of the transformer according to a first voltage corresponding to a previous period of the transformer and a second voltage corresponding to the present period of the transformer. The first reference current is K times the second reference current, and 0<K<1.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.