Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
US8767069B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2010 |
| Grant date | Jul 1, 2014 |
| Priority date | — |
| Expiry date | Feb 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a particle in response to a first light source, and processor coupled to the light detector. The processor may be configured create a first image by taking a first measurement of light and create a second image by interpolating the first image, where the second image has higher resolution than the first image. The processor may be configured to determine a difference between pixels of the second image and an expected distribution and discard the first measurement of light if the difference is above a predetermined threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.