Nanomechanical testing system

US8770036B2 · kind B2 · utility

Assignee

• Hysitron, Inc. · US

Inventors

• David James Vodnick · Eden Prairie, US
• Arpit Dwivedi · Chanhassen, US
• Lucas Paul Keranen · Hutchinson, US
• Michael David Okerlund · Minneapolis, US
• Roger William Schmitz · Hutchinson, US
• Oden Lee Warren · New Brighton, US
• Christopher David Young · Birmingham, US

Key dates

• Filing date: Aug 8, 2013
• Grant date: Jul 8, 2014
• Expiry date: Aug 8, 2033

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10T29/49826
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.