Amplitude profiling in filling-level measuring devices
US8776594B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2011 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Jul 16, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/35
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronics unit and a method for a filling-level measuring device for determining a filling level. The unit including an arithmetic unit determining a functional relationship between a distance between a filling material surface and the filling-level measuring device and an amplitude of a signal component reflected by the filling material surface and received by the filling-level measuring device; an amplitude profiler creating a profile of amplitude values of filling level echoes which have been measured so far; and an amplitude evaluator determining an expected amplitude of the filling level echo at a particular location with help of the profile of amplitude values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.